Olympus U-SIC4R 4" x 4" Stage with U-MSSP Solid Plate PHOTO TYPE OLYMPUS and semiconductor inspection applications

and semiconductor inspection applications

covering the most widely used wafer sizes in production and research environments

🔦 Dual brightfield & darkfield (BD) capability — a single objective supports both brightfield and darkfield reflected light imaging

Transmitted light polarized microscopy — orthoscopic observation of birefringent specimens in crossed polarizers on BX or CX series

Integration with image analysis and measurement software

Olympus U-SIC4R 4" x 4" Stage with U-MSSP Solid Plate PHOTO TYPE OLYMPUS and semiconductor inspection applicationsOLYMPUS U SIC4R RIGHT HAND MECHANICAL STAGE WITH PLATE 4 INCH BY 4 INCH TRAVEL METAL TOP PLATE INCLUDED (U MSSP) COMPATIBLE WITH: OLYMPUS BX AND MX SERIES MICROSCOPES CONDITION: NEW UNIVERSITY PURCHASE ORDERS ACCEPTED THANK YOU FOR VIEWING AND PLEASE FEEL FREE TO CALL OR EMAIL WITH ANY QUESTIONS