US$ 49.90
Semiconductor and electronics inspection — brightfield and darkfield surface defect detection on wafers
CONTINUOUS ZOOM RANGE FROM 10X - 64X
Thick specimens or samples mounted in fixtures
Premium 20× objective with brightfield and darkfield capability — ideal for industrial inspection and materials science applications
30 NA — Optimized for medium-magnification surface profiling with excellent lateral resolution and field of view
Olympus CX33 Trinocular Microscope NIKON ACCESSORIES Semiconductor and electronics inspection —Olympus CX33 Clinical Upright Trinocular Microscope LED, Plan Objectives, Complete System (OLYMPUS CX33) Plan 4X, 10X & 40X objectives flat field achromat correction for sharp, uniform images across the full field LED illumination instant ON OFF, consistent color temperature, long lifespan, energy efficient Trinocular head simultaneous eyepiece viewing and camera documentation output Right hand stage with finger rest ergonomic design for extended
US$ 49.90
US$ 49.90
US$ 29.90
US$ 49.90
US$ 29.90
US$ 29.90
US$ 29.90